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Ishino, Masahiko; Hasegawa, Noboru; Nishikino, Masaharu; Pikuz, T.*; Skobelev, I. Y.*; Faenov, A.*; Inogamov, N.*; Kawachi, Tetsuya; Yamagiwa, Mitsuru
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.958904_1 - 958904_6, 2015/09
Times Cited Count：1 Percentile：55.52(Optics)To study the ablation process induced by the soft X-ray laser pulse, we investigated the electron temperature of the ablating material. Focused soft X-ray laser pulses having a wavelength of 13.9 nm and duration of 7 ps were irradiated onto target surfaces, and we observed the optical emission from surfaces by use of an optical camera. On target surfaces, we could confirm damage structures, but no emission signal in the visible spectral range during ablation could be observed. Then, we estimated the electron temperature in the ablating matter, and we estimated the electron temperature to be lower than 1 eV and the process duration was shorter than 1000 ps. This result is in good accordance with the theoretical prediction. Our investigation implies that the spallative ablation occurs in the low electron temperature region of a non-equilibrium state of warm dense matter. We will present the current state of our eperimental results.
Nishikino, Masaharu; Kawachi, Tetsuya; Hasegawa, Noboru; Ishino, Masahiko; Minami, Yasuo*; Suemoto, Toru*; Onishi, Naofumi*; Ito, Atsushi*; Sato, Katsutoshi*; Faenov, A.*; et al.
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.958902_1 - 958902_7, 2015/09
Hasegawa, Noboru; Nishikino, Masaharu; Tomita, Takuro*; Onishi, Naofumi*; Ito, Atsushi*; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Izutsu, Rui*; Minami, Yasuo*; Baba, Motoyoshi*; et al.
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890A_1 - 95890A_8, 2015/09
Times Cited Count：1 Percentile：55.52(Optics)We have improved a soft X-ray laser (SXRL) interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot imaging of the nano-scaled structure dynamics of the laser induced materials. By the precise imaging optics and double time fiducial system having been installed, the lateral resolution on the sample surface and the precision of the temporal synchronization between the SXRL and Ti:Sapphire laser pulses were improved to be 700 nm and 2 ps, respectively. By using this system, the initial stage (before 200 ps) of the ablation process of the Pt surface pumped by 80 fs Ti:Sapphire laser pulse was observed by the comparison between the soft X-ray reflective image and interferogram. We have succeeded in the direct observation of the unique ablation process around the ablation threshold such as the rapid increase of the surface roughness and surface vibration.
Janulewicz, K. A.*; Kim, C. M.*; Steil, H.*; Kawachi, Tetsuya; Nishikino, Masaharu; Hasegawa, Noboru
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890N_1 - 95890N_7, 2015/09
Times Cited Count：0 Percentile：0(Optics)We describe measurement results on the polarization state of amplified spontaneous emission signal from a collisionally pumped Ni-like Ag soft X-ray laser with a transient inversion. The result obtained with a calibrated membrane beam splitter as a polarization state (P-state) selector shows that dominance one of the mutually perpendicular electric field components (p- or s-) in the output signal depends on the hydrodynamic state of the plasma medium. Two different hydrodynamic states were referred as a low gain and high gain regimes and the allocated P-states had dominant s- and p-component, respectively. It was also shown that due to correlations between p- and s-components in the process of coherent amplification of noise, correct description of the polarization state requires applying the generalized theory of polarization and formulated there the generalized degree of polarization.
Daido, Hiroyuki; Abe, Hiroshi; Shobu, Takahisa; Shimomura, Takuya; Tokuhira, Shinnosuke*; Takenaka, Yusuke*; Furuyama, Takehiro*; Nishimura, Akihiko; Uchida, Hirohisa*; Oshima, Takeshi
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